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electron backscatter diffraction ebsd mapping  (Bruker Corporation)


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    Bruker Corporation electron backscatter diffraction ebsd mapping
    Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of <t>EBSD</t> and nanoindentation mapping in the current study is indicated in (b).
    Electron Backscatter Diffraction Ebsd Mapping, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 96/100, based on 224 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/electron+backscatter+diffraction+ebsd+mapping/QUANTAX+EBSD/10__1016_slash_j__msea__2024__147556-67-0-9
    Average 96 stars, based on 224 article reviews
    electron backscatter diffraction ebsd mapping - by Bioz Stars, 2026-11
    96/100 stars

    Images

    1) Product Images from "Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper"

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper

    Journal: Materials Science and Engineering: A

    doi: 10.1016/j.msea.2024.147556

    Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of EBSD and nanoindentation mapping in the current study is indicated in (b).
    Figure Legend Snippet: Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of EBSD and nanoindentation mapping in the current study is indicated in (b).

    Techniques Used: Recrystallization

    Fig. 3. SEM/EBSD/nanoindentation results of the as-deposited CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.
    Figure Legend Snippet: Fig. 3. SEM/EBSD/nanoindentation results of the as-deposited CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Techniques Used:

    Fig. 4. SEM/EBSD/nanoindentation results of the 350 ◦C annealed CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.
    Figure Legend Snippet: Fig. 4. SEM/EBSD/nanoindentation results of the 350 ◦C annealed CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Techniques Used:

    Related Articles

    Recrystallization:

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper
    Article Snippet: Electron backscatter diffraction (EBSD) mapping was performed using a Bruker QUANTAX EBSD system at 15 kV.



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    Image Search Results


    Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of EBSD and nanoindentation mapping in the current study is indicated in (b).

    Journal: Materials Science and Engineering: A

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper

    doi: 10.1016/j.msea.2024.147556

    Figure Lengend Snippet: Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of EBSD and nanoindentation mapping in the current study is indicated in (b).

    Article Snippet: Electron backscatter diffraction (EBSD) mapping was performed using a Bruker QUANTAX EBSD system at 15 kV.

    Techniques: Recrystallization

    Fig. 3. SEM/EBSD/nanoindentation results of the as-deposited CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Journal: Materials Science and Engineering: A

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper

    doi: 10.1016/j.msea.2024.147556

    Figure Lengend Snippet: Fig. 3. SEM/EBSD/nanoindentation results of the as-deposited CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Article Snippet: Electron backscatter diffraction (EBSD) mapping was performed using a Bruker QUANTAX EBSD system at 15 kV.

    Techniques:

    Fig. 4. SEM/EBSD/nanoindentation results of the 350 ◦C annealed CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Journal: Materials Science and Engineering: A

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper

    doi: 10.1016/j.msea.2024.147556

    Figure Lengend Snippet: Fig. 4. SEM/EBSD/nanoindentation results of the 350 ◦C annealed CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Article Snippet: Electron backscatter diffraction (EBSD) mapping was performed using a Bruker QUANTAX EBSD system at 15 kV.

    Techniques: